Contrast and Resolution of Nanowires in Electrostatic Force Microscopy
نویسندگان
چکیده
منابع مشابه
Resolution and contrast in Kelvin probe force microscopy
The combination of atomic force microscopy and Kelvin probe technology is a powerful tool to obtain high-resolution maps of the surface potential distribution on conducting and nonconducting samples. However, resolution and contrast transfer of this method have not been fully understood, so far. To obtain a better quantitative understanding, we introduce a model which correlates the measured po...
متن کاملElectrostatic-free piezoresponse force microscopy
Contact and non-contact based atomic force microscopy (AFM) approaches have been extensively utilized to explore various nanoscale surface properties. In most AFM-based measurements, a concurrent electrostatic effect between the AFM tip/cantilever and sample surface can occur. This electrostatic effect often hinders accurate measurements. Thus, it is very important to quantify as well as remove...
متن کاملDynamic electrostatic force microscopy in liquid media
We present the implementation of dynamic electrostatic force microscopy in liquid media. This implementation enables the quantitative imaging of local dielectric properties of materials in electrolyte solutions with nanoscale spatial resolution. Local imaging capabilities are obtained by probing the frequency-dependent and ionic concentration-dependent electrostatic forces at high frequency (>1...
متن کاملNumerical study of the lateral resolution in electrostatic force microscopy for dielectric samples.
We present a study of the lateral resolution in electrostatic force microscopy for dielectric samples in both force and gradient modes. Whereas previous studies have reported expressions for metallic surfaces having potential heterogeneities (Kelvin probe force microscopy), in this work we take into account the presence of a dielectric medium. We introduce a definition of the lateral resolution...
متن کاملCarbon nanotube-modified cantilevers for improved spatial resolution in electrostatic force microscopy
The resolution of electrostatic force microscopy ~EFM! is enhanced when multiwalled carbon nanotubes are used as extensions on conventional silicon cantilevers. Multiwalled nanotubes provide robust, high aspect ratio, conducting tips that minimize topographic dependence of gradients in the capacitance between the tip/cantilever and the substrate. Comparison of simultaneously acquired topographi...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: IEEE Transactions on Nanotechnology
سال: 2009
ISSN: 1536-125X,1941-0085
DOI: 10.1109/tnano.2008.2009356